Product Details (This product is current)
Tuesday, July 3, 2007
Edited:
Friday, March 31, 2017
Product Ref No: 65
Order No/Series: n/a

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Pulse Generators()
Link: www.ixyscolorado.com/index.php/dei-scientific-instruments/dei-scientific-pulse-generators-laser-diode-drivers/hv-pulse-generator-instruments
Link: www.ixyscolorado.com/index.php/dei-scientific-instruments/dei-scientific-pulse-generators-laser-diode-drivers/hv-pulse-generator-instruments
High Voltage Pulse Generators
For Beam Steering, Gating, Driving Grids and Other Capacitive (High Impedance) Loads
These pulse generators modular pulsers are designed to drive capacitive loads such as deflection plates and extraction grids. When applied to these elements in a time-of-flight mass spectroscopy instrument or a linear accelerator, these pulses can be used for electron or ion beam steering, gating, deflection, or extraction.
In addition to time-of-flight and linear accelerator applications, these pulsers can be used to drive any high impedance, capacitive load, including:
Bench-top & Rack-mount models:
DEI's modular and OEM pulse generators and pulser modules are designed as compact, economical high performance pulse generators for use in spectrometers, accelerators, radar transmitters and other equipment and instruments requiring high voltage, precision voltage pulses. Their versatile design also makes them well suited for use in laboratory and test environments, in which a benchtop or rack mount instrument may not be the optimum choice.
In addition to the models shown below, DEI designs and manufactures custom and OEM pulse generators, modulators and drivers designed to our customer's specifications. Please contact DEI to discuss your specific application requirements.
High Speed, High Voltage Pulse Generators
for driving 50 Ohm loads
This can often be accomplished through the use of either a shunt resistor, a series resistor, or both. This is discussed in detail in the application note "Driving Capacitive Loads With The HV1000 Pulser."
Specific uses of these products include:
The I-V characteristics of semiconductor devices are functions of frequency and temperature. Curve tracers and other "DC" test systems typically step through a range of gate voltages and, at each gate voltage, sweep the drain voltage over the measurement range. The device essentially reaches thermal equilibrium and electronic (semiconductor-trap) equilibrium at each point, yielding different test characteristics than actual RF operational characteristics.
By pulsing the device using a pulse generator and taking a measurement during the pulse, the measurements can be taken before the device heats up. This circumvents the thermal effects associated with conventional "DC" testing, more closely approximates the characteristics of the device when operating at high frequencies, and doesn't activate the semiconductor "traps".
The design of these pulse generators provide fast rise and fall times, with minimal overshoot, undershoot and ringing. These controlled voltage waveforms allow the device under test (DUT) to stabilize at voltage within a few hundred nanoseconds, allowing I-V measurements to be made before device heating begins. The PVX-2505 features instrument-quality voltage and current monitors, providing a straight-forward means of measuring the voltage and current ofthe device under test.
Digital Delay & Low Voltage (TTL) Pulse Generators
Details available on request (information not available at time of printing)
For Beam Steering, Gating, Driving Grids and Other Capacitive (High Impedance) Loads
These pulse generators modular pulsers are designed to drive capacitive loads such as deflection plates and extraction grids. When applied to these elements in a time-of-flight mass spectroscopy instrument or a linear accelerator, these pulses can be used for electron or ion beam steering, gating, deflection, or extraction.
In addition to time-of-flight and linear accelerator applications, these pulsers can be used to drive any high impedance, capacitive load, including:
- Pockels cells and Q switches in LASER systems;
- Microchannel plates;
- Photomultiplier tubes;
- Control grids of power vacuum tubes;
- Acoustic transducers
Bench-top & Rack-mount models:
Model | Max. Output | Rise Time | Pulse Width | Max. Freq. |
±1500V | <25ns | 60ns to DC | >240KHz | |
±3500V | <=25ns | 60ns to DC | >30KHz | |
±6000V | <60ns | 150ns to DC | >10KHz | |
±10,000V | <60ns | 200ns to DC | >10KHz |
Modular & OEM models:
Model | Max. Output | Rise Time | Pulse Width | Max. Freq. | Notes |
±3000V | <25ns | <60ns to DC | >25KHz |
| |
±1500V | <25ns | <60ns to DC | >75KHz |
| |
1900V Differential | <15ns | <40ns to DC | >20KHz | Dual Differential (+ and -) Outputs, |
DEI's modular and OEM pulse generators and pulser modules are designed as compact, economical high performance pulse generators for use in spectrometers, accelerators, radar transmitters and other equipment and instruments requiring high voltage, precision voltage pulses. Their versatile design also makes them well suited for use in laboratory and test environments, in which a benchtop or rack mount instrument may not be the optimum choice.
In addition to the models shown below, DEI designs and manufactures custom and OEM pulse generators, modulators and drivers designed to our customer's specifications. Please contact DEI to discuss your specific application requirements.
High Speed, High Voltage Pulse Generators
for driving 50 Ohm loads
These pulse generators provide very fast rise and fall times, and narrow pulse widths. They are designed to drive 50 Ohm loads, however they can drive high impedance loads (deflection plates, grids, etc.) or low impedance loads such as laser diode drivers.
This can often be accomplished through the use of either a shunt resistor, a series resistor, or both. This is discussed in detail in the application note "Driving Capacitive Loads With The HV1000 Pulser."
Specific uses of these products include:
- Driving deflection plates and grids in time-of-flight mass spectroscopy;
- Pulsed testing and characterization of electronic components, including diodes, transient voltage protectors and resistors;
- Calibration of high voltage probes;
- Driving acoustic transducers for sonar, non-destructive testing, and other test and measurement applications;
- Driving photomultiplier tubes;
- Driving microchannel plates;
- Modulating electron beams
Model | Max. Output | Rise Time | Pulse Width | Max. Freq. | Notes |
850V | <10ns | 50ns to 10µs | 1MHz (5MHz burst) | Modular Pulse Generator |
Pulse Generators
For Pulsed I-V And Semiconductor Testing And CharacterizationThe I-V characteristics of semiconductor devices are functions of frequency and temperature. Curve tracers and other "DC" test systems typically step through a range of gate voltages and, at each gate voltage, sweep the drain voltage over the measurement range. The device essentially reaches thermal equilibrium and electronic (semiconductor-trap) equilibrium at each point, yielding different test characteristics than actual RF operational characteristics.
By pulsing the device using a pulse generator and taking a measurement during the pulse, the measurements can be taken before the device heats up. This circumvents the thermal effects associated with conventional "DC" testing, more closely approximates the characteristics of the device when operating at high frequencies, and doesn't activate the semiconductor "traps".
The design of these pulse generators provide fast rise and fall times, with minimal overshoot, undershoot and ringing. These controlled voltage waveforms allow the device under test (DUT) to stabilize at voltage within a few hundred nanoseconds, allowing I-V measurements to be made before device heating begins. The PVX-2505 features instrument-quality voltage and current monitors, providing a straight-forward means of measuring the voltage and current ofthe device under test.
Model | Max. Output | Max. Current | Rise Time | Pulse Width | Max. Freq. | Max. Duty Cycle |
50V | 10A | <200ns | <1µs to 100µs | 50KHz | 50% |
Digital Delay & Low Voltage (TTL) Pulse Generators
Details available on request (information not available at time of printing)